Ewer, JohnJohnEwerOrio, PatricioPatricioOrioMiguel PiñeiroWilson MenaJohn EwerPatricio Orio2026-03-242026-03-242021-12-1510.1371/journal.pcbi.1008933.t001https://cris-uv-2.scimago.es/handle/123456789/8901AIC values of single- and multi-weight model fit for every experiment.dataset