Ewer, JohnJohnEwerOrio, PatricioPatricioOrioMiguel PiñeiroWilson MenaJohn EwerPatricio Orio2026-03-242026-03-242021-12-1510.1371/journal.pcbi.1008933.t002https://cris-uv-2.scimago.es/handle/123456789/8902Values of τK and τf used for the fit of each experiments.Values of <i>τ<sub>K</sub></i> and <i>τ<sub>f</sub></i> used for the fit of each experiments.dataset